Pickering V-15 Phase IV ATE

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The Pickering V-15 Phase IV Automated Test Equipment (ATE) is a sophisticated computer-controlled testing system designed for the functional testing, diagnostic analysis, and burn-in of Integrated Circuicts (ICs) and other electronic devices.This particular model, the V-15 Phase IV, is an update and enhancement of its earlier versions (V-15 Phase II and III). It includes several improvements such as faster digitization, increased channel density, and expanded memory capacity, allowing for more complex and large-scale testing.Key features of Pickering V-15 Phase IV ATE include:1. High-Capacity Dual-Site Testing: The V-15 Phase IV is capable of handling large volumes of boards and devices simultaneously, via its dual-site configuration. This reduces test times and allows for high production throughput.2. Improved Digital and Analog Precision: The system's digitizers and analog-to-digital converters (ADCs), which convert signals from an IC into digital data, operate at faster speeds and with enhanced precision. This offers improved test sensitivity and accuracy.3. Expanded Memory Capacity: The system has a larger on-board memory, allowing it to store more device programs and diagnostic information. This reduces test times and enables more rapid fault diagnosis.4. Enhanced Communication and Networking Capabilities: Pickering V-15 Phase IV offers greater communication and networking options, including Gigabit Ethernet, USB 2.0, and RS-232 interfaces. This facilitates simpler and more flexible system integration.5. Comprehensive Testing and Diagnostic Capabilities: Pickering V-15 Phase IV provides a wide range of test capabilities, including functional testing, diagnostic analysis, and parametric testing. It also supports advanced debugging and validates activities up to full chip operation, including input level testing.Overall, the Pickering V-15 Phase IV ATE is designed to provide efficient and effective device testing, diagnostics, and burn-in for a variety of electronic devices, including ICs,MEMS, and more.